Leitz UVMP microscope equipped with a monochromator and a photomultiplier. |
Leitz UVMP microscope equipped with a monochromator and a photomultiplier. Magnifying fields of view 5:1 έως 4500:1. It provides observation possibilities at ultraviolet range from 205nm till 1100nm: Reflectance measurements (reflectivity), absorption or extinction, scattered-light intensity, remission (diffuse reflectance), intensity of fluorescence, phase difference (in interference and polarized light microscopy).
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Metalographic (Incident light illumination) microscope Leitz MM6 (W .Germany) |
Magnifying fields of view: 20:1 to 5000:1. It provides the following observation possibilities: Brightfield, darkground,, interference contrast, Nomarski. polarizing light, conoscopic investigations, grain size determination and micro-hardness measurements, hot stage (1250°C) observation and microphotography.
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Automatic Leitz microscope system Ergolux LAF-AMC plus MPV_3, with laser autofocus, scanning stage and Hamamatsu detector model R 928 photomultiplier with spectral range from 220 to 800nm (Incident and transmitted light illumination). System software: Rev ELMES- MPV & SP |
Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities:Brightfield, darkground, interference contrast, Nomarski. polarizing light, micromorphology analysis, grain size determination, thickness measurements (from 5 nm up to 150 µm) and microphotography.
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Leitz Orthoplan, Metalloplan and Orthoxul II, widefield microscope systems (W.Germany) |
Magnifying fields of view: 1 to 3000:1. It provides the following observation possibilities: Brightfield, phase contrast (transmitted and incident), phase contrast fluorescence, conoscopic investigations, dark field, interference contrast (transmitted and incident including the methods: Smith T System, Jamin-Lebedoff, Interference Contrast R, Francon Pol-interference for Incident light), transmitted fluorescence, interference contrast fluorescence, polarized, epi-pol, epi-fluorescence, epi-BF & epi-DF, grain size and micro-hardness measurements, 5 axes crystallography stage, microphotography, and hot stages (180°C to 1250°C) observationς.
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Leitz Ortholux microscopes. Magnifying fields of view: 10:1 to 1500:1 |
It provides the following observation possibilities: Brightfield, phase contrast (transmitted and incident), dark field, conoscopic investigations interference contrast (transmitted and incident including the methods: Smith T System and Jamin-Lebedoff,) polarized, epi-pol, epi-BF & epi-DF and micro-hardness measurements. |
Leitz Ortholux MPV_2 microscope photometer |

It is used for the following procedures and microscopic observation applications: Reflectance measurements (reflectivity), absorption or extinction, scattered-light intensity, remission (diffuse reflectance), intensity of fluorescence, phase difference (in interference and polarized light microscopy).
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Leitz transmitted interference microscope (Mach-Zender) |
Specialized instrument used in petrological and mineralogical microscopic observations (micro-relief characteristics of minerals micron-size inclusions, study of microstructure etc.).
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Reichert MEF- 2 microscope |
Metalographic (Incident light & transmitted illumination). Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Brightfield, phase contrast (transmitted and incident), fluorescence & phase contrast fluorescence, dark field, interference contrast nomarski, polarized, conoscopic investigations epi-pol, epi-fluorescence, grain size determination, micro-hardness measurements and microphotography. |
Reichert Zetopan microscopes. |
Magnifying fields of view: 5:1 to 3000:1.They provide the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / anoptral phase contrast / interference / interference phase contrast / polarization / conoscopic investigations / fluorescence, microphotography, microspectrophotometer measurements and grain size determination. |
Nikon Apophot microscopes |
Magnifying fields of view: 6:1 to 3000:1. They provide the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast/ interference / interference phase contrast, differential interference / polarization / conoscopic investigations / fluorescence and microphotography |
Nikon Metallographic invert microscope |
Magnifying fields of view: 5:1 to 3000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / interference, differential interference / polarization and microphotography. |
Nikon comparison microscope |
Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast/ interference, differential interference / polarization / fluorescence and microphotography. |
Olympus PME Metallographic microscope |
Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / polarization and microphotography. |
Olympus IM invert microscope |
Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / polarization and microphotography. |
Stereoscopes Leitz and Olympus |
Magnifying fields of view: 5:1 to 300:1 |