Our optical microscopes cover all methods of microscopic observation (normal & inverse) as well as Bright field and Dark field. Phase contrast, polarizing and stereoscopic observation, differential interference contrast, Nomarski, fluorescence, Confocal Laser Scanning Microscope and microspectrophotometry. The systems we use for microscopic observations are:
| Leitz UVMP microscope equipped with a monochromator and a photomultiplier. |
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| Metalographic (Incident light illumination) microscope Leitz MM6 (W .Germany) |
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| Automatic Leitz microscope system Ergolux LAF-AMC plus MPV_3, with laser autofocus, scanning stage and Hamamatsu detector model R 928 photomultiplier with spectral range from 220 to 800nm (Incident and transmitted light illumination). System software: Rev ELMES- MPV & SP |
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| Leitz Orthoplan, Metalloplan and Orthoxul II, widefield microscope systems (W.Germany) | Magnifying fields of view: 1 to 3000:1. It provides the following observation possibilities: Brightfield, phase contrast (transmitted and incident), phase contrast fluorescence, conoscopic investigations, dark field, interference contrast (transmitted and incident including the methods: Smith T System, Jamin-Lebedoff, Interference Contrast R, Francon Pol-interference for Incident light), transmitted fluorescence, interference contrast fluorescence, polarized, epi-pol, epi-fluorescence, epi-BF & epi-DF, grain size and micro-hardness measurements, 5 axes crystallography stage, microphotography, and hot stages (180°C to 1250°C) observationς.  |
| Leitz Ortholux microscopes. Magnifying fields of view: 10:1 to 1500:1 |  It provides the following observation possibilities: Brightfield, phase contrast (transmitted and incident), dark field, conoscopic investigations interference contrast (transmitted and incident including the methods: Smith T System and Jamin-Lebedoff,) polarized, epi-pol, epi-BF & epi-DF and micro-hardness measurements. |
| Leitz Ortholux MPV_2 microscope photometer |
It is used for the following procedures and microscopic observation applications: Reflectance measurements (reflectivity), absorption or extinction, scattered-light intensity, remission (diffuse reflectance), intensity of fluorescence, phase difference (in interference and polarized light microscopy). |
| Leitz transmitted interference microscope (Mach-Zender) |
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| Reichert MEF- 2 microscope |  Metalographic (Incident light & transmitted illumination). Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Brightfield, phase contrast (transmitted and incident), fluorescence & phase contrast fluorescence, dark field, interference contrast nomarski, polarized, conoscopic investigations epi-pol, epi-fluorescence, grain size determination, micro-hardness measurements and microphotography. |
| Reichert Zetopan microscopes. |  Magnifying fields of view: 5:1 to 3000:1.They provide the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / anoptral phase contrast / interference / interference phase contrast / polarization / conoscopic investigations / fluorescence, microphotography, microspectrophotometer measurements and grain size determination. |
| Nikon Apophot microscopes | Magnifying fields of view: 6:1 to 3000:1. They provide the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast/ interference / interference phase contrast, differential interference / polarization / conoscopic investigations / fluorescence and microphotography |
| Nikon Metallographic invert microscope |  Magnifying fields of view: 5:1 to 3000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / interference, differential interference / polarization and microphotography. |
| Nikon comparison microscope |  Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast/ interference, differential interference / polarization / fluorescence and microphotography. |
| Olympus PME Metallographic microscope | Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / polarization and microphotography. |
| Olympus IM invert microscope |  Magnifying fields of view: 5:1 to 2000:1. It provides the following observation possibilities: Transmitted and incident light for bright or dark – field / phase contrast / polarization and microphotography. |
| Stereoscopes Leitz and Olympus | Magnifying fields of view: 5:1 to 300:1 |
In order to measure the hardness and expansion of materials (synthetic and natural) our office is equipped with the following instruments:
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Reichert micro-hardness tester, with measuring objective and indenter with diamond prism (Vickers method). Testing loads from 5 to 200 g |
It is used with the microscope Reishert MEF-2. |
| Leitz automatic micro-hardness tester system , with micrometer measuring objective and indenters with diamond prisms (Vickers and Knoop indentations) plus calibration balances and microphotography. Testing loads from 5 to 400 p. | It is used with the microscopes Leitz: MM6, Orthoplan, Metalloplan and Ortholux. |
| Leitz Miniload 2 micro-hardness tester for Vickers, Knoop and Scratch Hardness Testing loads from 5 to 2000 p, microphotography. |
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| Leitz Universal Delatometer UMB model, includes furnace for up to 1150°C and to 1600°C, heating and cooling device, time recorder for temperature and expansions, reflecting galvanometer test pieces and comparsion rods. Suitable for differential and absolute method of investigations |
This equipment is used in surveys and to study the relationship between temperature and the linear thermal expansion of solid materials such as metals, alloys, ceramics, minerals, plastics etc. It also explores the relationship between materials and expansion / time. (transformation and precipitation processes) . |
